Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-05-16
2006-05-16
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S761010
Reexamination Certificate
active
07046020
ABSTRACT:
A probe for probing test points on a target board uses a printed circuit board (PCB) having a plurality of signal routes for routing signals to a test instrument. The probe also has a plurality of spring pins for probing the test points on the target board. Each of the spring pins is i) disposed perpendicularly to the PCB, and ii) electrically coupled to at least one signal route of the PCB. By way of example, the spring pins may be fit into holes in the PCB or, alternately, they may be electrically coupled to signal routes of a second PCB that is perpendicularly abutted to the first PCB. Methods for making and using such probes are also disclosed.
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Brent A. Holcombe, et al., U.S. Appl. No. 10/373,820, “Connector-Less Probe”, 20 pages of specification and eight- (8) sheets of drawings (Fig. 1-7), Filed Feb. 25, 2003.
Brent A. Holcombe, et al., U.S. Appl. No. 10/644,365, “Alignment/Retention Device for Connector-Less Probe”, 14 pages of specification and five- (5) sheets of drawings (Figs. 1-4C), Filed Aug. 20, 2003.
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Holcombe Brent A.
Johnson Kenneth
LaMeres Brock J.
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