Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-02-16
2010-10-05
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090, C324S762010
Reexamination Certificate
active
07808260
ABSTRACT:
A probe configured for use in the testing of integrated circuits includes a first end portion terminating in a foot (42), the foot defining a substantially flat surface configured to be connected to a substrate (400), a second end portion terminating in a tip (50), the tip being configured to contact an integrated circuit during testing of the integrated circuit, and a curved body portion (56) extending between the first end portion and the second end portion.
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The International Bureau of WIPO, “International Preliminary Report on Patentability and Written Opinion”, PCT/2006/005362, dated Sep. 17, 2007, 8 pages.
Hanoon Ilan
Laurent Edward T.
Malantonio Edward Lambert
Mironescu Dan
Tran Lich Thanh
Hickman Palermo & Truong & Becker LLP
Kulicke And Soffa Industries, Inc.
Tang Minh N
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