Prober for testing magnetically sensitive components

Details Prober for testing magnetically sensitive components Prober for testing magnetically sensitive components

2008-06-24

2010-06-22

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755090

Reexamination Certificate

active

07741860

ABSTRACT:
A prober for testing components comprises a lower frame, over which a probe holder plate is disposed at a distance therefrom for receiving test probes that make contact with the components to be tested and to which a displacement device is connected. A substrate carrier is disposed in the space between the frame and the probe holder plate, and the probe holder plate is provided with an opening, below which the substrate carrier can be displaced. To expand the scope of application of probers used for testing components, all those components of the prober that surround the substrate are made from a non-magnetic material.

REFERENCES:
patent: 5091691 (1992-02-01), Kamieniecki et al.
patent: 5828224 (1998-10-01), Maruyama
patent: 6545580 (2003-04-01), Hegde et al.

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