Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-08-14
2007-08-14
Abrams, Neil (Department: 2839)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
10502099
ABSTRACT:
A probe is disclosed, comprising a beam, which has a front end, an intermediate portion and a base end. The leading end is a portion for contacting a test subject through a contactor, the base end being a portion for fixing the probe. The probe includes a substantially trapezoidal contactor, which is fixed to the leading end of the beam.
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IBM Technical Disclosure Bulletin, Gladstein et al , vol. 22, No. 7, p. 2824 Dec. 1979.
Hosaka Hisatomi
Takekoshi Kiyoshi
Abrams Neil
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Tokyo Electron Limited
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