Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-03-01
2011-03-01
Nguyen, Vincent Q (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S755070, C073S105000
Reexamination Certificate
active
07898266
ABSTRACT:
A supported probe device that has a probe tip and probe body, the probe body having a sample facing surface and an opposing surface. The probe tip and a first electrode are on the sample facing surface. A second electrode is present on the probe body opposing surface. A third electrode is spaced from the second electrode, so that the second electrode is between the third electrode and the probe body. A first DC voltage source is electrically coupled to the first electrode, as is a first sensing circuit. A second DC voltage source is electrically coupled to the second electrode, and an AC voltage source electrically coupled to the third electrode. The probe body may be cantilevered.
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U.S. Appl. No. 11/933,729, filed Nov. 1, 2007, Inventor: Lee.
Bonin Wayne Allen
Setiadi Dadi
Stover Lance Eugene
Campbell Nelson Whipps LLC
Nguyen Vincent Q
Seagate Technology LLC
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