Probe with contact portion including Au and Cu alloy

Details Probe with contact portion including Au and Cu alloy Probe with contact portion including Au and Cu alloy

1991-11-29

1993-11-30

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, 324158F, G01R 1073, G01R 3102

Patent

active

052668959

ABSTRACT:
A probe to be electrically connected to an internal circuit of a semiconductor element, comprising a contact portion to be brought into pressure contact with an electrode formed on the semiconductor element, wherein the contact portion is made of an alloy consisting of Au, Cu, and an inevitable impurity. The contact resistance between the probe and electrode is low, and is maintained low in a stable manner even if the probe is repeatedly used.

REFERENCES:
patent: 3613001 (1971-10-01), Hastetter
patent: 3781681 (1973-12-01), Wagner et al.
patent: 4225819 (1980-09-01), Grau et al.
patent: 4574235 (1986-03-01), Kelly et al.

Affiliated with

Also associated with

Rating

Probe with contact portion including Au and Cu alloy does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe with contact portion including Au and Cu alloy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe with contact portion including Au and Cu alloy will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2099522