Probe wiping

Measuring and testing – Sampler – sample handling – etc. – Capture device

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

B01L 302

Patent

active

049914510

ABSTRACT:
Apparatus for removing fluid residue from an outer surface of a probe after it has been exposed to a fluid sample; the apparatus includes a wiper having a contact surface for wiping the residue from the outer surface of the probe, and a fluid flow path that cooperates with the contact surface for withdrawing wiped residue away from the contact surface and the probe; and a mechanism is provided for causing the contact surface to be swept along the outer surface of the probe. An apparatus for cleaning the outer surface of a probe after it is exposed to a fluid sample including a wiper for contacting the outer surface of the probe and a mechanism for causing relative motion between the wiper and the probe to wipe fluid from the outer surface.

REFERENCES:
patent: 2850754 (1958-09-01), Davis
patent: 3188181 (1965-06-01), Peterson et al.
patent: 3666420 (1972-05-01), Paatzsch
patent: 3875407 (1975-04-01), Hayne
patent: 4094196 (1978-06-01), Friswell
patent: 4457184 (1984-07-01), Shiono
patent: 4487081 (1984-12-01), De Vaughn et al.
patent: 4499053 (1985-02-01), Jones

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Probe wiping does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe wiping, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe wiping will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-12918

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.