Probe unit and its manufacture

Details Probe unit and its manufacture Probe unit and its manufacture

2006-02-14

2006-02-14

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

06998857

ABSTRACT:
A probe unit to be fixed to a probe device for testing functions of a test body. The probe unit includes: a substrate; probe pins formed on the substrate by lithography, the probe pins having distal ends protruded from the substrate and being made in contact with electrodes of the test body; and a positioning member formed on the substrate by lithography at a predetermined position relative to the probe pins, the positioning means abutting upon a member for positioning the substrate relative to the probe device.

REFERENCES:
patent: 4038599 (1977-07-01), Bove et al.
patent: 6531327 (2003-03-01), Kanamaru et al.
patent: 7-56493 (1995-06-01), None
patent: 7-283280 (1995-10-01), None
patent: 8-015318 (1996-01-01), None
patent: 8-110362 (1996-04-01), None
patent: 2552084 (1996-08-01), None
patent: 9-159696 (1997-06-01), None
patent: 10-339740 (1998-12-01), None
patent: 11-64425 (1999-03-01), None
patent: 11-337575 (1999-12-01), None
Copy of Korean Office Action dated Dec. 20, 2004 (and English translation of same).

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