Probe tip structure

Details Probe tip structure Probe tip structure

1997-12-09

2000-09-12

Metjahic, Safet

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, 324762, G01R 3102

Patent

active

061182877

ABSTRACT:
A probe tip structure is disclosed which is obtained from a solid piece of material having a bore machined therein which extends from a first end where the probe tip is attached to a coaxial transmission line to a second end where contact points are machined therein. The inner conductor of the transmission line extends into the bore to the second end of the probe tip where another contact point is formed. All contact points are adapted to contact a device under test. A rigid insulating structure is placed within the bore of the probe tip to hold the inner conductor securely in a fixed position.

REFERENCES:
patent: 4871964 (1989-10-01), Boll et al.
patent: 5373231 (1994-12-01), Boll et al.
patent: 5506515 (1996-04-01), Godshalk et al.
patent: 5565788 (1996-10-01), Burr et al.

Affiliated with

Also associated with

Rating

Probe tip structure does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe tip structure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe tip structure will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-99116