Probe-testing device and method of semiconductor device

Details Probe-testing device and method of semiconductor device Probe-testing device and method of semiconductor device

2007-12-31

2010-06-15

Nguyen, Hoai-An D (Department: 2831)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S601000

Reexamination Certificate

active

07737712

ABSTRACT:
A probe-testing device includes probe tips configured to apply inputs to pads of a semiconductor chip, wherein one of the probe tips is connected to a calibration pad for impedance adjustment and a calibration resistor is connected thereto.

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