Metallurgical apparatus – With control means responsive to sensed condition
Patent
1995-06-06
1996-08-27
Kastler, Scott
Metallurgical apparatus
With control means responsive to sensed condition
266 98, C21D 1100
Patent
active
055492800
ABSTRACT:
A probe system for reliably monitoring a condition in a metallurgical process is provided which includes a probe having a circuit for generating a low DC voltage signal indicative of a condition in the metallurgical process, and an impedance monitoring circuit electrically connected to the probe circuit for passively and continuously measuring the impedance of the probe circuit to determine its reliability without disturbing its DC signal. The probe may be a slag detector, a thermocouple, a sulfur sensor, or an oxygen sensor of the type used in steel manufacturing processes. The impedance monitoring circuit includes an oscillator assembly and a known impedance that is serially connected to the probe circuit by means of coupling capacitors that prevent the conduction of potentially biasing DC currents through the probe circuit. A band pass filter circuit having an input is connected between the known impedance and the probe circuit for generating a residual voltage which, when compared to the voltage applied by the oscillator circuit, indicates the impedance of the probe circuit. The impedance monitoring circuit advantageously detects a failure condition in such probes even when the failed probe continues to generate a low DC voltage that spuriously indicates a normal operating condition.
REFERENCES:
patent: 3871359 (1973-03-01), Pacela
patent: 4160948 (1979-07-01), Tytgat et al.
patent: 4342633 (1982-08-01), Cure
patent: 4413917 (1983-11-01), Cooper
patent: 4498044 (1985-02-01), Horn
patent: 4724376 (1988-02-01), Slough et al.
patent: 5063937 (1991-11-01), Ezenwa et al.
patent: 5091698 (1992-02-01), Grabs
patent: 5334970 (1994-08-01), Bailey
patent: 5375816 (1994-12-01), Ryan et al.
Operation of EMF Oxygen Probes in a Copper Refinery, J. Dompas and J. Van Melle, International Conference on Copper and it's Alloys, Amsterdam, Sep. 21-25, 1970.
Kings Donald H. M.
Sommers Robin A.
Usher John D.
Kastler Scott
Vesuvius Crucible Company
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