Probe system for device and circuit testing

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324 725, 324158F, G01R 106, G01R 3102

Patent

active

050669079

ABSTRACT:
A probe assembly is described for providing temporary connection to electrical circuits under test such as integrated circuits and the like. Individual probes are formed of suitable metal and are provided with a 90.degree. bend to create a depending portion for contact with a pad of a circuit under test and to form a supported length extending along a slot formed in the surface of a probe guide. The slot in the probe guide terminates at a hole for receiving the depending portion of the probe; the probe is supported by and positioned by the probe guide within the slot and hole provided therefore; an elastomeric pad is placed over a portion of the probe in the slot and a pressure plate urges the elastomer into contact with the probe to provide biasing force to urge the probe to extend through the probe guide hole into contact with the pad of the circuit under test. The pressure plate may contain signal traces for connection to the supported length of the probe to permit signals to be communicated from the probe tip in contact with the pad to a location remote from the probe.

REFERENCES:
patent: 3411125 (1968-11-01), Hill
patent: 3731191 (1973-05-01), Bullard et al.
patent: 3781681 (1973-12-01), Wagner et al.
patent: 3835381 (1974-09-01), Garretson et al.
patent: 3905098 (1975-09-01), Garretson et al.
patent: 3944922 (1976-03-01), Chambers et al.
patent: 3952410 (1976-04-01), Garretson et al.
patent: 4035723 (1977-07-01), Kvaternik
patent: 4045737 (1977-08-01), Coberly
patent: 4099119 (1978-07-01), Goetz
patent: 4116523 (1978-09-01), Coberly et al.
patent: 4123706 (1978-10-01), Roch
patent: 4151465 (1979-04-01), Lenz
patent: 4161692 (1979-07-01), Tarzwell
patent: 4164704 (1979-08-01), Kato et al.
patent: 4177425 (1979-12-01), Lenz
patent: 4267506 (1981-05-01), Shiell
patent: 4321532 (1982-03-01), Luna
patent: 4476433 (1984-10-01), Logan
patent: 4480223 (1984-10-01), Aigo
patent: 4523144 (1985-06-01), Okubo et al.
patent: 4593243 (1986-06-01), Lao et al.
patent: 4623839 (1986-11-01), Garretson et al.
patent: 4636722 (1987-01-01), Ardezzone
patent: 4649339 (1987-03-01), Grangroth et al.
patent: 4812745 (1989-03-01), Kern
patent: 4827211 (1989-05-01), Strid et al.
patent: 4847553 (1989-07-01), Seinecke
IBM Technical Disclosure Bulletin, vol. 14, No. 2, Jul. 1971, p. 568.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Probe system for device and circuit testing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe system for device and circuit testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe system for device and circuit testing will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1372856

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.