Probe system and method for operating a probe system

Details Probe system and method for operating a probe system Probe system and method for operating a probe system

2006-01-10

2006-01-10

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06984999

ABSTRACT:
A probe system includes a transceiver unit and a probe head that is mobile with respect to the transceiver unit and has a feeler. The probe head has a circuit which includes a sensor unit, a CPU, a transmitting stage and a direct-voltage source. In response to a deflection of the feeler, the sensor unit triggers an electrical signal which is converted in the transmitting stage into an electromagnetic signal. The circuit is configured such that, between the direct-voltage source and the transmitting stage, a voltage transformer is connected by which a voltage is able to be generated which is greater than the output voltage of the direct-voltage source and is applied to the transmitting stage. A method is for operating a probe system.

REFERENCES:
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patent: 6526670 (2003-03-01), Carli
patent: 6664782 (2003-12-01), Slates
patent: 1 179 173 (2002-02-01), None
patent: 1 179 173 (2003-09-01), None

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