Probe system

Details Probe system Probe system

1996-06-07

1998-08-25

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 3102

Patent

active

057986517

ABSTRACT:
A probe system according to the present invention has a plurality of exploration portions disposed in a line, spaced apart from one another for predetermined distances and each having a test head, for establishing electrical connection between the test head and electrodes of a subject of exploration so as to explore electrical characteristics of the subject of exploration, a conveyance passage running parallel to the line of the exploration portions, a retainer portion on which a plurality of the subjects of exploration are placed, which is facing to the conveyance passage and which is capable of elevating vertical with respect to the conveyance passage at a position above the conveyance passage, and delivery and acceptance unit arranged capable of moving along the conveyance passage and arranged to deliver and accept the subjects of exploration between the retainer portion and each of the exploration portions.

REFERENCES:
patent: 4639664 (1987-01-01), Chiu et al.
patent: 4900939 (1990-02-01), Aoyama
patent: 5488292 (1996-01-01), Tsuta
patent: 5510724 (1996-04-01), Itoyama et al.

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