Probe structures with physically suspended electronic...

Details Probe structures with physically suspended electronic... Probe structures with physically suspended electronic...

2006-04-21

2009-08-25

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

07579856

ABSTRACT:
A probe apparatus can include a substrate, a contact structure attached to the substrate, and an electronic component electrically connected to the contact structure. The electronic component can be attached to the contact structure.

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