Probe station with low noise characteristics

Details Probe station with low noise characteristics Probe station with low noise characteristics

2005-01-25

2005-01-25

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C174S036000

Reexamination Certificate

active

06847219

ABSTRACT:
A cable includes an inner conductor, an inner dielectric, and a guard conductor, where the inner dielectric is between the inner conductor and the guard conductor. The cable also includes an outer dielectric, and a shield conductor, where the outer dielectric is between the guard conductor and the shield conductor. The cable further includes an additional layer of material between the outer dielectric and the shield conductor of suitable composition for reducing triboelectric current generation between the outer dielectric and the shield conductor to less than that which would occur were the outer dielectric and the shield conductor to directly adjoin each other.

REFERENCES:
patent: 2812502 (1957-11-01), Doherty
patent: 4365109 (1982-12-01), O'Loughlin
patent: 4479690 (1984-10-01), Inouye et al.
patent: 6284971 (2001-09-01), Atalar et al.
patent: 0 505 981 (1992-03-01), None
Knauer, William, “Fixturing for Low-Current/Low-Voltage Parametric Testing,”Evaluation Engineering,pp. 150-153, Nov. 1990.

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