Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-01-25
2005-01-25
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C174S036000
Reexamination Certificate
active
06847219
ABSTRACT:
A cable includes an inner conductor, an inner dielectric, and a guard conductor, where the inner dielectric is between the inner conductor and the guard conductor. The cable also includes an outer dielectric, and a shield conductor, where the outer dielectric is between the guard conductor and the shield conductor. The cable further includes an additional layer of material between the outer dielectric and the shield conductor of suitable composition for reducing triboelectric current generation between the outer dielectric and the shield conductor to less than that which would occur were the outer dielectric and the shield conductor to directly adjoin each other.
REFERENCES:
patent: 2812502 (1957-11-01), Doherty
patent: 4365109 (1982-12-01), O'Loughlin
patent: 4479690 (1984-10-01), Inouye et al.
patent: 6284971 (2001-09-01), Atalar et al.
patent: 0 505 981 (1992-03-01), None
Knauer, William, “Fixturing for Low-Current/Low-Voltage Parametric Testing,”Evaluation Engineering,pp. 150-153, Nov. 1990.
Cowan Clarence E.
Gray Frank
Lesher Timothy
McDonald Cynthia L.
Miller Brad
Cascade Microtech, Inc.
Chernoff Vilhauer McClung & Stenzel LLP
Nguyen Vinh P.
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