Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-04-28
1997-03-11
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324754, G01R 3102
Patent
active
056105290
ABSTRACT:
A probe station suitable for low noise measurements includes a chuck for supporting a test device and a supporting surface for the test device. The probe station has means for controlling the temperature in the vicinity of the test device by sensing the temperature and, in response to the sensing, alternatively raising or lowering the temperature. At least two layers including a first electrically conductive layer adhered to an insulator layer are disposed between the supporting surface and the chuck. The electrically conductive layer is electrically connected to one of the chuck and supporting surface.
REFERENCES:
patent: 3289046 (1966-11-01), Carr
patent: 3710251 (1973-01-01), Hagge et al.
patent: 4115736 (1978-09-01), Tracy
patent: 4426619 (1984-01-01), Demand
patent: 4491173 (1985-01-01), Demand
patent: 4503335 (1985-03-01), Takahashi
patent: 4691831 (1987-09-01), Suzuki et al.
patent: 4734872 (1988-03-01), Eager et al.
patent: 4757255 (1988-07-01), Margozzi
patent: 4759712 (1988-07-01), Demand
patent: 4777434 (1988-10-01), Miller et al.
patent: 4784213 (1988-11-01), Eager et al.
patent: 4845426 (1989-07-01), Nolan et al.
patent: 4856904 (1989-08-01), Akagawa
patent: 4968931 (1990-11-01), Littlebury et al.
patent: 4978914 (1990-12-01), Akimoto et al.
patent: 5001423 (1991-03-01), Abrami et al.
patent: 5006796 (1991-04-01), Burton et al.
patent: 5077523 (1991-12-01), Blanz
patent: 5084671 (1992-01-01), Miyata et al.
patent: 5164661 (1992-11-01), Jones
patent: 5210485 (1993-05-01), Kreiger et al.
patent: 5220277 (1993-06-01), Reitinger
patent: 5266889 (1993-11-01), Harwood et al.
patent: 5325052 (1994-06-01), Yamashita
patent: 5345170 (1994-09-01), Schwindt et al.
patent: 5461328 (1995-10-01), Deveraux et al.
Low Level Measurements For Effective Low Current, Low Voltage, and High Impedance Measurements by Keithley Instruments, Inc., Jun. 1984, pp. 12, and 24.
Appliciton Note 1 Controlled Environment Enclosure for Low Temperature Wafer Probing in a Moisture-Free Environment, Temptronic Corporation, at least one year prior to filing date, (Mar. 1995) 2 pages.
Test Station Acessories (7000-LTE Light Tight Enclosure, Dry Box for Low Temperature Probing), Micromanipulator Sales and Service, Inc.,at least one year prior to filing date, (Mar. 1995), 1 page.
Model TP03000 Series ThermoChuck Systems for Probing, Characterization and Failure Analysis of Wafers, Chips and Hybrids at High and Low Temperatures, Temptronic Corporation, at least one year prior to filing date, (Mar. 1995), pp. 2-5.
Yousuke Yamamoto, A Compact Self-Shielding Prober for Accurate Measurement of On-Wafer Electron Devices, IEEE Transactions on Instrumentation and Measurement, vol. 38, No. 6, Dec. 1989, pp. 1088-1093.
K. Cole, Temptronics "Guarded" Chuck, Nov. 15, 1989, 1 page.
Ken Cole, facsimile from Ken Cole, Mar. 10, 1995, 2 pages.
Cascade Microtech, Inc.
Karlsen Ernest F.
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