Measuring and testing – Probe or probe mounting
Patent
1997-10-21
1999-05-25
Dombroske, George
Measuring and testing
Probe or probe mounting
73290R, 73304C, 734321, G01D 2100
Patent
active
059071125
ABSTRACT:
A secondary seal assembly is used with a process instrument including a probe assembly and an electric housing assembly. The probe assembly includes an adaptor receivable in an opening of a process vessel, a probe extending through the adaptor into the process vessel, and a primary seal between the probe and the adaptor. A probe terminal provides an electrical connection between the probe and the electric housing assembly. The secondary seal comprises an elongate extension housing adapted to be mechanically connected at one end to the adaptor and at another end to the electric housing assembly. A shaft insert is received in the extension housing having a terminal at each of opposite ends, a first terminal for providing an electrical connection to the electric housing assembly and a second terminal for providing an electrical connection to the probe terminal. A seal between the shaft insert and the extension housing provides a secondary seal to the process vessel.
REFERENCES:
patent: 2624790 (1953-01-01), White
patent: 2955466 (1960-10-01), Coles
patent: 3119052 (1964-01-01), Tsuji
patent: 3843832 (1974-10-01), Petersen et al.
patent: 4029897 (1977-06-01), Mayer et al.
patent: 4054744 (1977-10-01), Beaman
patent: 4137558 (1979-01-01), Beaman
patent: 4499641 (1985-02-01), Fleckenstein
patent: 4507521 (1985-03-01), Goellner
patent: 4594892 (1986-06-01), Asmundsson
patent: 4809129 (1989-02-01), Hansen, III et al.
patent: 4902962 (1990-02-01), Ishikawa
patent: 5227587 (1993-07-01), Paterek
patent: 5267684 (1993-12-01), Catheline et al.
patent: 5272921 (1993-12-01), Foller et al.
patent: 5307678 (1994-05-01), Cost
patent: 5391839 (1995-02-01), Lang et al.
patent: 5669263 (1997-09-01), Borchers et al.
Amrozowicz Paul D.
Dombroske George
Magnetrol International Inc.
LandOfFree
Probe secondary seal does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Probe secondary seal, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe secondary seal will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-402190