Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-07-10
2007-07-10
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C439S289000
Reexamination Certificate
active
10918236
ABSTRACT:
A probe retention kit may include a plurality of probe retention devices, each having: (i) a base; (ii) a retention mechanism, coupled to the base, for mechanically coupling a probe substrate with the plurality of probe retention devices; and (iii) solder legs to be inserted into a printed circuit board, the solder legs having opposite ends that extend through the base and provide an alignment mechanism for receiving the probe substrate. Alternative probe retention devices, and systems and methods using same, are also disclosed.
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Brent A. Holcombe, et al., Connector-Less Probe, U.S. Appl. No. 10/373,820, filed Feb. 25, 2003.
Brent A. Holcombe, et al., “Alignment/Retention Device for Connector-Less Probe”, U.S. Appl. No. 10/644,365, filed Aug. 20, 2003.
Brock J. LaMeres, et al., “Backside Attach Probe, Components thereof, and Methods for Making and Using Same”, U.S. Appl. No. 10/902,405, filed on Jul. 28, 2004.
Brock J. LaMeres, et al., “Probes with Perpendicularly Disposed Spring Pins, and Methods of Making and Using Same”, U.S. Appl. No. 10/781,086, filed Feb. 17, 2004.
Agilent Technologies, Inc., www.agilent.com, “Probing Solutions for Logic Analyzers”, Mar. 1, 2004, pp. 1-57.
Brock J. LaMeres, et al., “Apparatus, Method, and Kit for Probing a Pattern of Points on a Printed Circuit Board”, U.S. Patent Application (17 pages of specification including claims and abstract, and six (6) sheets of formal drawings (Figs. 1-6), filed Aug. 13, 2004.
Holcombe Brent
Johnson Kenneth
LaMeres Brock J.
Agilent Technologie,s Inc.
Karlsen Ernest
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