Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-03-04
2008-03-04
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
11289452
ABSTRACT:
A probe is mountable to a printed circuit board testing device which performs a test on a predetermined land and/or a predetermined via hole of a printed circuit board. The probe includes a probe tip and a protrusion. The probe tip is contactable with the land and/or the via hole and projectable from the probe. The protrusion is disposed at a surface of the probe, the surface of the probe being disposed opposite to where the probe tip is projectable. The protrusion is grounded by a reaction pressure that is generated when the probe tip contacts the land and/or the via hole.
REFERENCES:
patent: 6275054 (2001-08-01), Boyle
patent: 6525553 (2003-02-01), Reynoso et al.
Hara Mikio
Kagiyama Syuji
Makita Shigenori
Miyazawa Susumu
Miyazawa Yoshino
Fujitsu Limited
Nguyen Ha Tran
Nguyen Trung Q.
Staas & Halsey , LLP
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