Probe pin array for socket testing

Details Probe pin array for socket testing Probe pin array for socket testing

2005-02-22

2005-02-22

Pert, Evan (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

06859055

ABSTRACT:
The present invention includes an assembly for testing a socket. The assembly includes a plurality for probe pins extending from a housing. The housing includes a chamfered alignment guide for aligning the probe pins with openings in the socket.

REFERENCES:
patent: 3599093 (1971-08-01), Oates
patent: 4496903 (1985-01-01), Paulinski
patent: 4701703 (1987-10-01), Malloy
patent: 5850148 (1998-12-01), Nam
patent: 5955888 (1999-09-01), Frederickson et al.
patent: 6064195 (2000-05-01), Clayton et al.
patent: 6198300 (2001-03-01), Doezema et al.
patent: 6356090 (2002-03-01), Deshayes

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