Probe or measuring head with illumination of the contact region

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07868634

ABSTRACT:
A probe or measuring head for measuring an electrical signal of an electrical contact has an electrically conducting feeler (1) which protrudes out of a housing (3) and has, at its end, a contact region (4) which comes into touching contact with the electrical contact. The contact region (4) of the feeler (1) and the measurement environment surrounding the contact region (4) of the feeler (1) is illuminated by the light beams from a light source (101, 102, . . . , 10n, 10o) connected to the probe or measuring head.

REFERENCES:
patent: 1639889 (1927-08-01), Humm
patent: 3786340 (1974-01-01), Otten et al.
patent: 3910701 (1975-10-01), Henderson et al.
patent: 4028621 (1977-06-01), Bloxam
patent: 4126380 (1978-11-01), Borm
patent: 4356442 (1982-10-01), Beha
patent: 5175772 (1992-12-01), Kahn et al.
patent: 5672964 (1997-09-01), Vinci
patent: 6377054 (2002-04-01), Beha
patent: 2009/0206859 (2009-08-01), Swaim et al.
patent: 0 570 840 (1993-11-01), None
patent: 0 974 844 (2000-01-01), None
patent: 1 203 962 (2002-05-01), None
patent: 05196637 (1993-08-01), None
patent: 09026435 (1997-01-01), None
International Search Report for PCT/EP2006/002641 dated May 24, 2006.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Probe or measuring head with illumination of the contact region does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe or measuring head with illumination of the contact region, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe or measuring head with illumination of the contact region will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2666370

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.