Probe of scanning electrochemical microscope

Details Probe of scanning electrochemical microscope Probe of scanning electrochemical microscope

1994-08-04

2000-09-26

Tung, T.

Chemistry: electrical and wave energy

Apparatus

Electrolytic

204416, 204418, 204434, 2057905, 427117, G01N 2726

Patent

active

061238171

ABSTRACT:
This invention concerns a scanning electrochemical microscope prove capable of measuring a specimen which does not have a smooth surface. The probe is insulated by a monomolecular adsorption film, a monomolecular laminated film, or polymer film (i.e., organic thin film). Its front end has the organic thin film removed by an electric field evaporation process to expose the metal wire, and the current is detected by this portion. Active hydrogen is present on the surface of the metal wire which preferably has a pointed end. A silane surfactant such as octadecyl trichlorosilane or the like is brought into contact with the metal wire surface to cause a dehydrochlorination reaction, thereby forming a monomolecular film, a monomolecular laminated film, or polymer film which is chemically adsorbed by colvant siloxane bonds to the surface of the metal. Only the front end portion of the metal wire is evaporated by the electric field, so that a probe with a very fine tip is obtained.

REFERENCES:
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S. Wasserman et al.; "The Structure of Self-Assembled Monolayers of Alkylsiloxanes on Silicon: A Comparison of Results from Ellipsometry . . .", J. Am. Chem. Soc. 1989 month unavailable, 111, pp. 5852-5861.
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