Probe mounting device for a scanning probe microscope

Measuring and testing – Probe or probe mounting

Reexamination Certificate

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Details

C248S500000

Reexamination Certificate

active

07114405

ABSTRACT:
The invention relates to a probe (207) mounting device for a scanning probe microscope, especially a scanning force microscope, comprising a retaining member (200) for installation in a measuring assembly of a scanning probe microscope. The probe (207) is detachably mounted on the retaining member (200) by means of a clamping member (201), the clamping member being secured in self-locking fashion to the retaining member (200).

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patent: 2004/0140424 (2004-07-01), Kwon et al.
patent: WO 02 071412 (2002-09-01), None

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