Measuring and testing – Probe or probe mounting
Reexamination Certificate
2006-10-03
2006-10-03
Williams, Hezron (Department: 2856)
Measuring and testing
Probe or probe mounting
C248S500000
Reexamination Certificate
active
07114405
ABSTRACT:
The invention relates to a probe (207) mounting device for a scanning probe microscope, especially a scanning force microscope, comprising a retaining member (200) for installation in a measuring assembly of a scanning probe microscope. The probe (207) is detachably mounted on the retaining member (200) by means of a clamping member (201), the clamping member being secured in self-locking fashion to the retaining member (200).
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Haschke Heiko
Sünwoldt Olaf
Frank Rodney
JPK Instruments AG
Smith Patent Office
Williams Hezron
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