Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-03-25
2008-03-25
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754120, C324S754120
Reexamination Certificate
active
11216645
ABSTRACT:
Probe modules, methods of use of probe modules, and methods of preparing probe modules, are disclosed. A representative embodiment of a probe module, among others, includes a redistribution substrate and a probe substrate interfaced with the redistribution substrate. The probe substrate is operative to test at least one signal of at least one optoelectronic device under test. The probe substrate is operative to interface with electrical and optical components.
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Meindl James D.
Ogunsola Oluwafemi O.
Thacker Hiren D.
Benitez Joshua
Georgia Tech Research Corporation
Nguyen Vinh
Thomas Kayden Horstemeyer & Risley LLP
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