Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Reexamination Certificate
2007-05-01
2009-10-27
Dole, Timothy J (Department: 2831)
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
C324S754090, C250S306000, C250S309000, C850S033000, C850S058000
Reexamination Certificate
active
07609048
ABSTRACT:
Provided is a probe microscope for measuring a surface potential of a sample, including a contact electrification mechanism (circuit (C)) for bringing an electroconductive probe device into contact with a surface of the sample and applying a voltage in the contact state to induce electrification on the surface of the sample, and a potential measuring mechanism (circuit (K)) for measuring the surface potential of the sample caused by the contact electrification mechanism in a non-contact state of the electroconductive probe device and the surface of the sample, wherein the electrification induced by the contact electrification mechanism and the measurement of the surface potential by the potential measuring mechanism alternate in time series while the voltage applied during the contact is gradually changed, thereby measuring a correlation between the applied voltage and the surface potential.
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Baldridge Benjamin M
Canon Kabushiki Kaisha
Dole Timothy J
Fitzpatrick ,Cella, Harper & Scinto
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