Probe inspection apparatus

Details Probe inspection apparatus Probe inspection apparatus

1997-05-16

1999-08-10

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, 3241581, G01R 3126

Patent

active

059364165

ABSTRACT:
A probe inspection apparatus includes a mounting section mounting an inspection target, a loader section having a convey mechanism for conveying the inspection target on the mounting section, a prober section for inspecting the inspection target conveyed by the convey mechanism, a controller for controlling movements of the prober section and the loader section, and a display unit having a display panel for displaying an operation panel for operating the controller. The operation panel has operation touch keys for operating the controller with an operation content displayed in a user country language, and identification symbol touch keys for displaying an operation content corresponding to the operation keys in a language different from the user country language.

REFERENCES:
patent: 5307011 (1994-04-01), Tani
patent: 5561386 (1996-10-01), Funaki et al.
patent: 5777485 (1998-07-01), Tanaka et al.
patent: 5798651 (1998-08-01), Aruga et al.

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