Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-06-06
2006-06-06
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S762010
Reexamination Certificate
active
07057407
ABSTRACT:
A system for low-current testing of a test device includes a probing device for probing a probing site on the test device. The probing device includes a dielectric substrate having first and second sides, an elongate conductive path on the first side of the substrate, an elongate probing element connected to the elongate conductive path so as to extend in a cantilevered manner beyond the substrate, and a conductive area on the second side of the substrate. The probe housing is matingly detachably engageable with the probing device.
REFERENCES:
patent: 3648169 (1972-03-01), Wiesler
patent: 4783625 (1988-11-01), Harry et al.
patent: 6232789 (2001-05-01), Schwindt
patent: 6850082 (2005-02-01), Schwindt
Cascade Microtech, Inc.
Chernoff Vilhauer & McClung & Stenzel
Nguyen Vinh P.
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