Probe holder for testing of a test device

Details Probe holder for testing of a test device Probe holder for testing of a test device

2005-02-01

2005-02-01

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010

Reexamination Certificate

active

06850082

ABSTRACT:
A system for low-current testing of a test device includes a probing device for probing a probing site on the test device. The probing device includes a dielectric substrate having first and second sides, an elongate conductive path on the first side of the substrate, an elongate probing element connected to the elongate conductive path so as to extend in a cantilevered manner beyond the substrate, and a conductive area on the second side of the substrate. The probe housing is matingly detachably engageable with the probing device.

REFERENCES:
patent: 3648169 (1972-03-01), Wiesler
patent: 3930809 (1976-01-01), Evans
patent: 4001685 (1977-01-01), Roch
patent: 4035723 (1977-07-01), Kvaternik
patent: 4116523 (1978-09-01), Coberly et al.
patent: 4151465 (1979-04-01), Lenz
patent: 4161692 (1979-07-01), Tarzwell
patent: 4480223 (1984-10-01), Aigo
patent: 4783625 (1988-11-01), Harry et al.
patent: 4791363 (1988-12-01), Logan
patent: 4888550 (1989-12-01), Reid
patent: 4894612 (1990-01-01), Drake et al.
patent: 5334931 (1994-08-01), Clarke et al.
patent: 5594358 (1997-01-01), Ishikawa et al.
patent: 5610529 (1997-03-01), Schwindt
patent: 6232789 (2001-05-01), Schwindt
patent: 6384615 (2002-05-01), Schwindt
patent: 6496024 (2002-12-01), Schwindt
patent: 288 234 (1991-03-01), None
patent: 93 13 420.7 (1993-12-01), None
patent: 196 18717 (1998-01-01), None
patent: WO 8000101 (1980-01-01), None

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