Probe holder for low voltage, low current measurements in a wate

Details Probe holder for low voltage, low current measurements in a wate Probe holder for low voltage, low current measurements in a wate

1998-08-31

2000-09-26

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 3102

Patent

active

061247235

ABSTRACT:
A probe holder for a wafer probe station is comprised of a pair of over-and-under rigid extensions, one of which receives the probe shank and the other of which is connected to the probe to make a Kelvin connection. The two coaxial extensions are supported by a vertical tube which contains a pair of coaxial cables connected to triaxial cables outside of the probe station enclosure.

REFERENCES:
patent: 5345170 (1994-09-01), Schwindt et al.
patent: 5457398 (1995-10-01), Schwindt et al.
patent: 5506515 (1996-04-01), Godshalk et al.
patent: 5525911 (1996-06-01), Marumo et al.
patent: 5663653 (1997-09-01), Schwindt et al.
"Fixturing for Low-Current/Low Voltage Parametric Testing" article William Knauer, Evaluation Engineering, Nov. 1990, pp. 150-153.

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