Geometrical instruments – Gauge – Movable contact probe – per se
Patent
1997-02-03
1998-09-15
Fulton, Christopher W.
Geometrical instruments
Gauge
Movable contact probe, per se
33556, G01B 5016, G01B 5012
Patent
active
058062009
ABSTRACT:
The invention is directed to a probe head of a coordinate measuring apparatus for conducting measurements on a workpiece. The probe head has a first longitudinal axis and has a probe pin mounted on the probe head. The probe pin has a second longitudinal axis defining an angle with the first longitudinal axis. A joint-free, rigidly-configured adjusting device adjusts this angle when the probe pin is not in contact with the workpiece.
REFERENCES:
patent: 4360973 (1982-11-01), McMurtry
patent: 4375723 (1983-03-01), McMurtry
patent: 5113593 (1992-05-01), Cusack
patent: 5121551 (1992-06-01), Linder et al.
patent: 5396712 (1995-03-01), Herzog
Ahnelt Peter
Brenner Kurt
Roth Roland
Seitz Karl
Carl-Zeiss-Stiftung
Fulton Christopher W.
Ottesen Walter
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