Geometrical instruments – Gauge – Movable contact probe – per se
Patent
1988-11-30
1990-07-24
Haroian, Harry N.
Geometrical instruments
Gauge
Movable contact probe, per se
33561, 33556, G01B 1124
Patent
active
049426710
ABSTRACT:
Truncated pyramid mounting configurations and relationships are disclosed as inherently and reproducibly determining an accurate zero-position as between a probe head and a probe pin that is deflectably carried by the probe head. And the same principle of accurately determining zero position is also described in application to the automated releasable chucking of interchangeable probe pins and/or of an auxiliary probe head, as to the installed probe head of a coordinate-measuring machine.
In one described case of truncated triangular pyramid mountings, the zero position is determined by concurrent engagement of six seating points which are distributed radially and axially with respect to the common central longitudinal axis of the involved geometric pyramids.
The mounting configurations have high torsional rigidity and a relatively large region within which self-centering to the zero position is achieved.
Furthermore, thise mounting configurations are characterized by an azimuth-angle distribution of relatively uniform force in opposition to a probe-pin or the like deflection, and associated lift-off, from the fully seated zero position.
REFERENCES:
patent: 4532713 (1985-08-01), Feichtinger
Aehnelt Hans-Peter
Enderle Eckhard
Kaufmann Dieter
Carl-Zeiss-Stiftung
Haroian Harry N.
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