Geometrical instruments – Gauge – Having a movable contact probe
Patent
1990-10-04
1992-01-28
Will, Thomas B.
Geometrical instruments
Gauge
Having a movable contact probe
33559, 33561, G01B 520, G01B 728
Patent
active
050833790
ABSTRACT:
The invention concerns a probe head of the so-called measuring type with scales which supply signals proportional to the position of a probe pin in its deflected state. A probe-pin carrier is the movable part of the probe head, being mounted indirectly on at least three intermediate bodies which, in their turn, are guided linearly in a fixed or housing part of the probe head. As a result of the symmetrical arrangement of the linear guides and the identical mass of intermediate bodies, like inertial responses characterize probe deflection in all directions in space. The workpiece-contacting force is, therefore, independent of coordinate direction in a dynamic operation of the probe head, as in the course of a continuous scan of a workpiece profile.
REFERENCES:
patent: 3520063 (1970-07-01), Rethwish et al.
patent: 4203225 (1980-05-01), Nilsson
patent: 4530160 (1985-07-01), Feichtinger
patent: 4716656 (1988-01-01), Maddock et al.
patent: 4866854 (1989-09-01), Seltzer
patent: 4934065 (1990-06-01), Hajdukiewicz et al.
patent: 4942671 (1990-07-01), Enderle et al.
Aehnelt Peter
Enderle Eckhard
Carl-Zeiss-Stiftung Heidenheim/Brenz
Will Thomas B.
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