Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-10-16
2007-10-16
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S757020, C324S758010
Reexamination Certificate
active
11028940
ABSTRACT:
A probe head for testing devices formed on a semiconductor wafer includes a plurality of probe DUT (device under test) arrays. Each device under test includes pads that are urged into pressure contact with probes in a corresponding probe DUT array. The probe arrays patterns have discontinuities such as indentations, protuberances, islands and openings that are opposite at least one device when the probes contact the pads.
REFERENCES:
patent: 4837622 (1989-06-01), Whann et al.
patent: 5210485 (1993-05-01), Kreiger et al.
patent: 5568054 (1996-10-01), Iino et al.
patent: 5623214 (1997-04-01), Pasiecznik, Jr.
patent: 5642054 (1997-06-01), Pasiecznik, Jr.
patent: 5818249 (1998-10-01), Momohara
patent: 6714828 (2004-03-01), Eldridge et al.
patent: 6729019 (2004-05-01), Grube et al.
patent: 2001/0015652 (2001-08-01), Eldridge et al.
Henson Roy John
Long John M.
Burraston N. Kenneth
FormFactor Inc.
Tang Minh N.
LandOfFree
Probe head arrays does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Probe head arrays, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe head arrays will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3901068