Probe head arrangement for conductor line testing with at least

Details Probe head arrangement for conductor line testing with at least Probe head arrangement for conductor line testing with at least

1982-10-08

1985-05-28

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, 324158F, G01R 106, G01R 3102

Patent

active

045203148

ABSTRACT:
A probe head arrangement for contacting a plurality of closely adjacent conductor lines 2 comprises a minimum of one probe head 3, where a plurality of fingers 4 together with a back 5 are made in one piece of monocrystalline silicon in semiconductor technique. A plurality of such probe heads 3 are composed to form a tester. At the beginning of each test it is determined which fingers 4 are to be, and are not to be placed onto the individual conductor lines 2 of a card 1 to be tested. Subsequently, the short and interruption tests can be implemented after the correlation of finger and probe head addresses with the conductor line addresses.

REFERENCES:
patent: 3963985 (1976-06-01), Geldermans
patent: 4063172 (1977-12-01), Faure et al.
patent: 4177425 (1979-12-01), Lenz
patent: 4182937 (1980-01-01), Greenwood

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