Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-08-23
2011-08-23
Phan, Huy (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754030, C324S756030, C324S762050
Reexamination Certificate
active
08004296
ABSTRACT:
One embodiment is a probe head for contacting microelectronic devices substantially lying in a test plane, the probe head including: (a) one or more substrate tiles having one or more probe tips disposed on a top surface thereof; and (b) a registration-alignment apparatus that holds the one or more substrate tiles: (i) in position so that the one or more probe tips are held in the test plane, and (ii) aligned so that the one or more probe tips are substantially coplanar to the test plane, which registration-alignment apparatus includes: (i) one or more capture elements affixed, directly or indirectly, to a frame; (ii) three or more posts mechanically supporting each of the one or more substrate tiles; and (iii) alignment actuators affixed, directly or indirectly, to the frame and the posts, which alignment actuators may be actuated to enable the posts to move in response to forces applied thereto from the one or more substrate tiles, and may be actuated to prevent the posts from moving.
REFERENCES:
patent: 4157066 (1979-06-01), Pretty
patent: 4240778 (1980-12-01), Korytko
patent: 4585991 (1986-04-01), Reid et al.
patent: 4751457 (1988-06-01), Veenendaal
patent: 4968931 (1990-11-01), Littlebury et al.
patent: 5336992 (1994-08-01), Saito et al.
patent: 5555422 (1996-09-01), Nakano
patent: 5735201 (1998-04-01), Hirao et al.
patent: 6064217 (2000-05-01), Smith
patent: 6320372 (2001-11-01), Keller
patent: 6674627 (2004-01-01), Kund
patent: 6784678 (2004-08-01), Pietzschmann
patent: 6828810 (2004-12-01), Kanamaru et al.
patent: 6911835 (2005-06-01), Chraft et al.
patent: 6977514 (2005-12-01), Kohno et al.
patent: 7064566 (2006-06-01), Khandros et al.
patent: 7071012 (2006-07-01), Tan et al.
patent: 7230438 (2007-06-01), Crippen
patent: 7382143 (2008-06-01), Di Stefano
patent: 7692433 (2010-04-01), Eldridge et al.
patent: 2006/0255814 (2006-11-01), Eldridge et al.
patent: 2006/0290367 (2006-12-01), Hobbs et al.
patent: 2008/0036480 (2008-02-01), Hobbs et al.
patent: 2008/0100312 (2008-05-01), Breinlinger
patent: 2008/0196474 (2008-08-01), Di Stefano et al.
Di Stefano Peter T.
Di Stefano Thomas H.
Karavakis Konstantine N.
Centipede Systems, Inc.
Einschlag Michael B.
Phan Huy
Vazquez Arleen M
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