Geometrical instruments – Gauge – Movable contact probe – per se
Reexamination Certificate
2006-08-29
2008-12-16
Bennett, G. Bradley (Department: 2841)
Geometrical instruments
Gauge
Movable contact probe, per se
C033S559000
Reexamination Certificate
active
07464484
ABSTRACT:
A probe head includes a stationary component and pressure-sensitive sensors, the sensors being stationary relative to the fixed component, and a deflectable probe element. The probe element has a longitudinal axis, a first contact point and a second contact point. Because of contact of the probe element, pressure forces are able to be introduced into the sensors via the first contact point. In response to a further deflection of the probe element, the latter is able to be transferred to a stop position, in which the second contact point of the probe element touches the stationary component in a supporting manner. The probe element is arranged such that the pressure forces that are able to be introduced into the sensors in the stop position are limited, a first distance between the first contact point and the longitudinal axis being shorter than a second distance between the second contact point and the longitudinal axis.
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Bennett G. Bradley
Dr. Johannes Heidenhain GmbH
Kenyon & Kenyon LLP
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