Geometrical instruments – Gauge – Movable contact probe – per se
Reexamination Certificate
2008-07-01
2008-07-01
Bennett, G. Bradley (Department: 2841)
Geometrical instruments
Gauge
Movable contact probe, per se
Reexamination Certificate
active
11512834
ABSTRACT:
A probe head includes sensors having, in each instance, a pressure-sensitive surface, electrical signal being producible by the sensors when pressure forces are acting. Furthermore, the probe head has mechanical transmission elements and a holding element for positioning the transmission elements with respect to the sensors. The holding element is fixed in a stationary manner relative to the sensors and is configured such that the transmission elements are movable relative to the sensors in a direction having a directional component orthogonal to the surface. Furthermore, the probe head includes a probe element, which is deflectable relative to the sensors. The probe element, the sensors and the transmission elements are arranged in a mechanical operative connection such that by contacting the probe element, a change in the level of the electrical signal is producible by at least one of the sensors.
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patent: 2002-267435 (2002-09-01), None
Bennett G. Bradley
Dr. Johannes Heidenhain GmbH
Kenyon & Kenyon LLP
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