Probe having a power detector for use with microwave or millimet

Details Probe having a power detector for use with microwave or millimet Probe having a power detector for use with microwave or millimet

1994-09-09

1996-04-16

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, C01R 106

Patent

active

055086306

ABSTRACT:
A system for probing a circuit is disclosed. In particular, a system for monitoring power levels close to the tip of a measurement probe in order to more accurately monitor the power applied to a circuit is contemplated. Microwave and millimeter wave signals are monitored through the use of a directional coupler which is mounted proximate the probe tip of a measurement probe. Power delivered to the probe tip is then detected by a signal created in the directional coupler. Connected to the directional coupler is a diode. The voltage across the diode is monitored and is indicative of the power delivered to the probe tip. A control signal resulting from the diode voltage may provide feedback control to a power source which delivers power to the measurement probe. Thus, utilizing feedback control a more accurate power delivery system is provided.

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Allen et al., "On-Wafer Measurement and Modeling of Millimeter-Wave GaAs Schottky Mixer Diodes," 1992 IEEE MTT-S International Microwave Symposium Digest, pp. 743-746, 1992 International Microwave Symposium, Albuquerque, NM; Jun. 1992.
Ladbrooke, "Improved Instrument for Probing Static Potential Profiles in Semiconductor Devices," Electronics Letters, vol. 9, No. 14 (Jul. 12, 1973).

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