Electrical connectors – With coupling movement-actuating means or retaining means in... – For direct connection to a flexible tape or printed circuit...
Reexamination Certificate
2008-05-30
2010-02-02
Abrams, Neil (Department: 2839)
Electrical connectors
With coupling movement-actuating means or retaining means in...
For direct connection to a flexible tape or printed circuit...
C439S362000, C439S940000, C029S743000
Reexamination Certificate
active
07654847
ABSTRACT:
A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips. An alignment assembly for aligning a probe with respect to a device to be tested includes a first alignment block, a second alignment block, and an alignment piece connecting the first alignment block and the second alignment block. The first alignment block and the second alignment block are arranged to be attached to the device to be tested to align the probe with respect to the device to be tested.
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Soubh et al.; “Probe Having a Field-Replaceable Tip”; U.S. Appl. No. 11/668,455, filed Jan. 29, 2007.
Koopman Steve
McCartin Doug
Soubh Emad
Wooldridge Jeremy
Abrams Neil
Keating & Bennett LLP
Samtec Inc.
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