Probe having a field-replaceable tip

Details Probe having a field-replaceable tip Probe having a field-replaceable tip

2007-01-29

2009-06-23

Dinh, Phuong K (Department: 2839)

Electrical connectors

Adapted to cooperate with duplicate connector

Butt coupling

C439S498000

Reexamination Certificate

active

07549884

ABSTRACT:
A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips.

REFERENCES:
patent: 4885533 (1989-12-01), Coe
patent: 5924879 (1999-07-01), Kameyama
patent: 6290532 (2001-09-01), Vermeersch et al.
patent: 6466000 (2002-10-01), Nightingale

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