Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-12-12
2006-12-12
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S072500, C324S765010
Reexamination Certificate
active
07148712
ABSTRACT:
A probe provides electrical communication between a coating and a processing system. One optional feature includes an outwardly projecting, electrically conductive engaging member that is held in a captivation structure releasably retained in a housing and engages a contact that is inside the probe and connected with the processing system. Another optional feature of the probe provides the electrically conductive engaging member in the form of a pin or pins captivated in a light-transmissive structure adjacent a light-emitting source. Another optional feature of the probe includes a restraining structure that defines a frustoconical seat for engaging a conical distal end of an electrically conductive pin that is adapted to contact the coating.
REFERENCES:
patent: 3253338 (1966-05-01), Burnette, Jr.
patent: 3681724 (1972-08-01), Shepard
patent: 4168873 (1979-09-01), Luna
patent: 4504780 (1985-03-01), Marsella
patent: 5200695 (1993-04-01), Kazama
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Drawing No. 51-84-0014-00001 Revision D Sheet 1 of 3, Mar. 20, 2005.
Drawing No. 51-84-0014-00001 Revision D Sheet 2 of 3, Mar. 20, 2005.
Drawing No. 51-84-0014-00001 Revision D Sheet 3 of 3, Mar. 20, 2005.
Drawing No. 51-84-0015-00000 Revision A Sheet 1 of 3, Mar. 4, 2005.
Drawing No. 51-84-0015-00000 Revision A Sheet 2 of 3, Mar. 4, 2005.
Drawing No. 51-84-0015-00000 Revision A Sheet 3 of 3, Mar. 4, 2005.
Drawing No. 51-65-0035-00083P Revision A Sheet 1 of 1, Mar. 4, 2005.
Prey, Jr. John E.
Tom Joseph
Hollington Jermele
Oxford Instruments Measurement Systems LLC
Vazquez Arleen M.
Wood Phillips Katz Clark & Mortimer
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