Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-03-15
2005-03-15
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
06867609
ABSTRACT:
A connector-less probe is disclosed. The probe permits probing of a board or bus without the use of a mating connector. The probe has a support attached to the probing end of the probe. A spring pin and an isolation network are attached to the support. The support is arranged substantially perpendicular to a target board during probing of a test point on the target board. The spring pin engages the test point on the target board. The spring pin is arranged substantially perpendicular to the target board when the spring pin engages the test point on the target board, and the spring pin is securely attached to the support so that the spring pin is substantially parallel to the support. The isolation network is electrically coupled to the spring pin so that the spring pin is located between the isolation network and the test point during probing of the test point. The isolation network is also securely attached to the support.
REFERENCES:
patent: 3757219 (1973-09-01), Aksu
patent: 4161692 (1979-07-01), Tarzwell
patent: 4724377 (1988-02-01), Maelzer et al.
patent: 4743839 (1988-05-01), Rush
patent: 5172051 (1992-12-01), Zamborelli
Eskeldson David Daniel
Holcombe Brent A.
Self Bobby J.
Soubh Emad Radwan
Agilent Technologie,s Inc.
Nguyen Vinh P.
LandOfFree
Probe for testing circuits, and associated methods does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Probe for testing circuits, and associated methods, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe for testing circuits, and associated methods will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3403342