Probe for testing an electrical device

Details Probe for testing an electrical device Probe for testing an electrical device

2003-08-29

2008-11-11

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010, C324S754090

Reexamination Certificate

active

07449906

ABSTRACT:
A probe having a first and a second arm portion extending between first and second connecting portions connecting the first and second arm portions respectively at their front end portion and base end portion, and a needle point portion below the first connecting portion. At least one of the entire first and second arm portions or the upper or lower edge portions of the first and second arm portions are arcuate.

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