Probe for testing a device under test

Details Probe for testing a device under test Probe for testing a device under test

2008-07-01

2008-07-01

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C327S104000

Reexamination Certificate

active

07394269

ABSTRACT:
A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

REFERENCES:
patent: 5565788 (1996-10-01), Burr et al.
patent: 7271603 (2007-09-01), Gleason et al.

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