Probe for surface-resistivity measurement and method for...

Details Probe for surface-resistivity measurement and method for... Probe for surface-resistivity measurement and method for...

2006-10-10

2006-10-10

Benson, Walter (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S696000

Reexamination Certificate

active

07119556

ABSTRACT:
A probe for surface-resistivity measurement is provided in a surface-resistivity measuring apparatus for measuring a surface resistivity of a target. The probe includes an electrode and a contact portion. The contact portion has a specific resistance larger than the electrode. The contact portion is disposed on the electrode. The contact portion is capable of surface-contact with the target.

REFERENCES:
patent: 3810007 (1974-05-01), Wiseman et al.
patent: 2000-304769 (2000-11-01), None

Affiliated with

Also associated with

Rating

Probe for surface-resistivity measurement and method for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe for surface-resistivity measurement and method for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe for surface-resistivity measurement and method for... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3616662