Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Patent
1993-05-04
1994-10-18
Gutierrez, Diego F. F.
Thermal measuring and testing
Temperature measurement
In spaced noncontact relationship to specimen
374137, 374141, 250330, G01J 502, G01J 512
Patent
active
053562186
ABSTRACT:
A probe (10,30,40) for forming images of surfaces (11) facilitates simultaneous formation of both thermal and atomic force microsocopy images. The probe (10,30,40) includes a heat sensing assembly (15) that has a heat sensing element (19,38,42). An electrically isolating and thermally conductive tip (22,48) projects from the heat sensing assembly. The probe (10) also has a reflective element (24) that is positioned between a first end of the heat sensing assembly (15) and the electrically isolating and thermally conductive tip (22).
REFERENCES:
patent: 3262315 (1966-07-01), Lux et al.
patent: 3477122 (1969-11-01), Hamrick
patent: 3531642 (1970-09-01), Barnes et al.
patent: 3930159 (1975-12-01), Marquet
patent: 4112362 (1978-09-01), Hower et al.
patent: 4360277 (1982-11-01), Daniel et al.
patent: 4379461 (1983-04-01), Nilsson et al.
patent: 4416553 (1983-11-01), Huebscher
patent: 4747698 (1988-05-01), Wickramasinghe et al.
patent: 4806755 (1989-02-01), Duerig et al.
patent: 4941753 (1990-07-01), Wickramasinghe
C. C. Williams et al, "Scanning Thermal Profiler", Applied Physics Letter, vol. 49, No. 23, pp. 1587-1589, 1986.
Brochure "Microlevers", Park Scientific Instruments, Sunyvale, Calif. (no date).
Newsletter, "Nano Tips", Digital Instruments, Inc., vol. 1, Issue 2, Apr. 1989.
Newsletter, "Nano Tips", Digital Instruments, Inc., vol. 4, Issue 1, (no date).
Majumdar et al, "Thermal Imaging Using The Atomic Force Microscope", Presentation to American Vacuum Society, Nov. 9-13, 1992.
J. Carrejo et al, "Multi-Purpose Metal Cantilever Tip For Simultaneous AFM And Thermal Imaging", Technical Developments, Motorola, Inc., vol. 18, pp. 12-13, Mar., 1993.
Carrejo Juan P.
Hopson Theresa J.
Legge Ronald N.
Barbee Joe E.
Gutierrez Diego F. F.
Hightower Robert F.
Motorola Inc.
LandOfFree
Probe for providing surface images does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Probe for providing surface images, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe for providing surface images will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2367975