Probe for near-field microscope, the method for...

Details Probe for near-field microscope, the method for... Probe for near-field microscope, the method for...

2007-07-10

2007-07-10

LeGasse, Jr., Francis M. (Department: 2112)

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

C250S309000, C356S501000, C977S849000, C977S862000

Reexamination Certificate

active

11196104

ABSTRACT:
In a manufacture of a probe for a scattering type near-field microscope, there is provided a method of coating, with a high reproducibility, uniform metal particles efficiently inducing a surface enhanced Raman scattering. It has been adapted such that, in the probe for the scattering type near-field microscope, one part or all of the probe due to an interaction of at least an evanescent field is coated by metal particles which don't mutually adhere and have a particle diameter of 10 nm or larger and 50 nm or smaller in radius of curvature.

REFERENCES:
patent: 5489774 (1996-02-01), Akamine et al.

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