Probe for magnetic resonance spectrometric measures at very high

Details Probe for magnetic resonance spectrometric measures at very high Probe for magnetic resonance spectrometric measures at very high

1989-03-01

1990-09-18

Tokar, Michael J.

Electricity: measuring and testing

Particle precession resonance

Spectrometer components

324307, 324321, G01R 3320

Patent

active

049581260

ABSTRACT:
A probe for spectrometric measurements of magnetic resonance at very high temperatures includes a resonator (3) within which is disposed a sample (9) to be analyzed. A laser beam from a laser (6) is conducted toward and focused upon the sample (9) for heating the same, and levitation of the sample (9) during measurement proceedings within the resonator (3), as a means of thermally isolating the sample (9) from its surroundings, is achieved by means of a levitation gas from a gas source (18) which is introduced into the resonator (3) by means of a constriction zone aperture (17) whereby the sample (9) is maintained within an upper cavity (16) of the resonator (3).

REFERENCES:
patent: 4088944 (1978-05-01), Engler
patent: 4201941 (1980-05-01), Fyfe et al.
patent: 4275350 (1981-06-01), Hill et al.
patent: 4446430 (1984-05-01), Stejskal
patent: 4456882 (1984-06-01), Doty
patent: 4739270 (1988-04-01), Daugaard
patent: 4806868 (1989-02-01), Schulke

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