Liquid crystal cells – elements and systems – Nominal manufacturing methods or post manufacturing... – Defect correction or compensation
Reexamination Certificate
1999-08-12
2001-10-09
Dudek, James A. (Department: 2871)
Liquid crystal cells, elements and systems
Nominal manufacturing methods or post manufacturing...
Defect correction or compensation
Reexamination Certificate
active
06300998
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Technical Field
The present invention relates to a probe for inspecting a liquid crystal display panel suitably used in a display inspection before mounting a bare chip (integrated circuit), and the like, for supplying a driving signal, and an apparatus and a method for inspecting a liquid crystal display panel using the probe.
2. Discussion
In general, liquid crystal display panels are subjected to inspection for short circuits, breakage, and display properties, and the like, and bare chips, and the like, which are electronic parts for supplying a driving signal, are then actually mounted on the liquid crystal display panels that have passed the inspections. In the inspections of the liquid crystal panels, a method has been adopted in which pin probes are positioned and brought into contact with terminals formed on the panels and on which the bare chips are to be mounted, the actual driving signal is supplied via the pin probes, and the display thereof is checked.
However, since the pin probe includes therein a fine spring, and the like, it has a drawback of being very mechanically breakable. In addition, since the terminal spaces of the bare chips are usually narrow, the pin probes are arranged very close together. Therefore, there is a problem in that it is difficult to manufacture an inspecting apparatus, and the manufacturing cost of the inspecting apparatus is very high.
The present invention is made in view of the above-mentioned problem, and has as objects thereof to provide a probe for inspecting a liquid crystal display panel which is unbreakable in the inspection of liquid crystal display panels and which can be manufactured at low cost, and to provide an apparatus and a method for inspecting liquid crystal display panels using the probe.
SUMMARY OF THE INVENTION
In order to achieve the above-mentioned object, according to a first aspect of the invention, there is provided a probe for inspecting a liquid crystal display panel in which liquid crystal is sealed between a pair of panel substrates, a display state is controlled by a plurality of scanning lines and a plurality of data lines, and scanning line terminals for the plurality of scanning lines and data line terminals for the plurality of data lines are formed on the panel substrates, respectively, the probe comprising a flexible substrate on which is formed a conductive pattern including connecting terminals connected to at least one of the scanning line terminals and the data line terminals, and on which is mounted an electronic part for supplying a signal for driving at least one of the scanning lines and the data lines to the connecting terminals via the conductive pattern.
According to such a configuration, the driving signal is supplied to the scanning line terminals or the data line terminals formed on the panel substrate via the connecting terminals, which are portions of the conductive pattern formed on the flexible substrate. Therefore, the liquid crystal display panel can be inspected for the display without the aid of a pin probe.
In addition, according to a second aspect of the invention, there is provided an apparatus for inspecting a liquid crystal display panel in which liquid crystal is sealed between a pair of panel substrates, a display state is controlled by a plurality of scanning lines and a plurality of data lines, and scanning line terminals for the plurality of scanning lines and data line terminals for the plurality of data lines are formed on the panel substrates, respectively, the apparatus comprising: a first connector for securing connecting terminals formed on a first flexible substrate to the scanning line terminals formed on one of the panel substrates; a second connector for securing connecting terminals formed on a second flexible substrate to the data line terminals formed on the other one of the panel substrate; a first supply means mounted on the first flexible substrate and supplying a signal for driving the scanning lines to the connecting terminals formed on the first flexible substrate via a conductive pattern; and a second supply means mounted on the second flexible substrate and supplying a signal for driving the data lines to the connecting terminals formed on the second flexible substrate via a second conductive pattern formed on the second flexible substrate and including the connecting terminals.
According to the described configuration, the inspection of the liquid crystal display panel using the inspecting probe according to the first aspect of the invention becomes possible.
Further, according to a third aspect of the invention, there is provided a method for inspecting a liquid crystal display panel in which liquid crystal is sealed between a pair of panel substrates, a display state is controlled by a plurality of scanning lines and a plurality of data lines, and scanning line terminals for the plurality of scanning lines and data line terminals for the plurality of data lines are formed on the panel substrates, respectively, the method comprising the steps of: securing connecting terminals formed on a first flexible substrate to the scanning line terminals formed on one of the panel substrates, while securing connecting terminals formed on a second flexible substrate to the data line terminals formed on the other one of the panel substrates; and supplying a signal for driving the scanning lines to the connecting terminals on the first flexible substrate by an electronic circuit mounted on the first flexible substrate via a conductive pattern formed on the first flexible substrate, while supplying a signal for driving the data lines to the connecting terminals on the second flexible substrate by an electronic circuit mounted on the second flexible substrate via a conductive pattern formed on the second flexible substrate.
According to the described method, the inspection of the liquid crystal display panel using the inspecting probe according to the first aspect of the invention becomes possible.
REFERENCES:
patent: 5608558 (1997-03-01), Katsumi
Dudek James A.
Harness & Dickey & Pierce P.L.C.
Seiko Epson Corporation
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